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  LUMO levels measurement

LEIPS system LE-1

Features

Using new low energy technique of inverse photoemission spectroscopy(IPES),

LE-1 realize the highly precise measurement of LUMO levels(the electron affinity)

Sample damage large reduction

l  The kinetic energy of electron is lowered less than 5eV, the damage threshold of most organic materials.

Highly accurate LUMO levels measurement

l  It is possibile to measure thin film condition same as device.

l  Direct LUMO levels measurement as electron relaxtion in unoccupied sates.

l  Achieved the same measurement precision as that of HOMO levels measurement with photoemission spectroscopy(XPS, UPS).

l  The measurement resolution less than 0.5eV

l  LEIPS spetra probes the unoccupied density of states.

Simple operation in spite of UHV (10‑8Pa level) system

l  Automatic transfer of the sample, pumping, and measurement can be easily done while it is used ultra high vacuum condition(10-8Pa level).

l  The effective measurement is possible by stocking 4 pieces of sample at the buffer chamber.

Simple measurement peration

l  Using the LEIPS standard software, the electron affinities can be calculated and obtained with easy operation.

Extensibility

l  Combining the LE-1 with photoemission spectroscopy system(XPS, UPS), the sample can be measure under the same condition.

 

l  The carrier BOX standard features that sample conveyance is possible without exposing the atmosphere.

The accurate LUMO level (electron affinity) measurement of the organic semiconductor was difficult

It is equally important to know correct value of the LUMO level (electronic conduction) and the HOMO level (holl conduction) for development, the performance improvement of the organic semiconductor.

But there was no appropriate method available to measure the LUMO levels accurately.

 

PES

photoemission spectroscopy(XPS, UPS)

IPES

Inverse photoemission spectroscopy

It popularization as a measuring method of HOMO level.

In principle, IPES is theoretically superior to measure the light emission h v when electrons relaxed in the LUMO level directly.

[Problem]

l  LUMO level is frequently estimated by adding optical gap(measure by several methods) and the ionizing energy(HOMO level with respect to vacuum level). But the optical gap is usually smaller than the transport gap which is interpreted as the exciton binding energy, not accurate.

[Problem]

l  Signal strength is weak, and sensitivity is low.

l  Low energy resolution

l  There is the sample damage to irradiate a large quantity of electrons those energy range is about ~ 15eV.

 

Specification

Loadlock chambe

Ultimate pressure

Less than 1×10-4Pa

Pumping system

TMP+DryP

Carrier Box specifications

Convery several samples without exposing the atmosphere.

Vacuum gauge

Full-range type

Buffer chamber

Ultimate pressure

Less than 1×10-7Pa

Pumping system

TMP+DryP

CCD Camera system

For visual confirmation of sample position

Revolver sample holding mechanism

Stock 4 pcs of sample

Vacuum gauge

Nude ion gauge

LEIPS Chamber

Ultimate pressure

Less than 1×10-7Pa

Pumping system

TMP+DryP

CCD Camera system

For visual confirmation of sample position

Electron gun

For exclusive use of LEIPS&IPES

Photomultiplier unit

High sensitivity near UV light detection

Vacuum gauge

Nude ion gauge

Electron gun

 

Sweep irradiation electron energy

0~50Ev

Cathode material

BaO

Beam Focus

φ2~3mm

Sample electric current value

~10μA

Photomultiplier unit

Sensitivity wavelength

160nm~650nm

Band pass filter

260nm, 285nm

*Easily interchangeable to others

Window material

Quartz

control

Sample transfer, Pumping

Automatic control by the touch panel operation

LUMO level measurement

Automatic measurement by the LEIPS software

Indication&operation terminal

Desktop PC

OS

Windows 7

Performanc

Item

Performance

Remarks

Energy resolution

Less than 5eV

The first derivative of Ag sample’s LEIPS spectra at ferimi edge (FWHM)

Utilities

Appearance

Main unit dimension

2430mm(W)×745mm(D)×130mm(H)

Frame dimension

550mm(W)×900mm(D)×1900mm(H)×2

Mass

Main unit+Frame

Approximately 400kg

Power

Main unit

3φ200V-50A

Electron gun

1φ100V-5A

PMT

1φ100V-5A

Compressed air

Main unit

More than 0.5MPa

N2(Vent)

Main unit

0.1~0,2MPa

 

n  The system shall be warranted for the period of one year from the date of acceptance under operated correct method for use(Consumables are excluded)

n  The BaO cathode of the electron gun is consumable.

Activated work is necessary at the time if exchange for new BaO cathode.

 

The cathode which performed activated work in us (charge) is guaranteed three months.


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