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Seebeck Measurement Systems

Overview:


Seebeck Measurement System allows users to make automatic measurements of the temperature-dependent Seebeck potential of metals, semiconductors and other electrically conductive samples over a temperature range from 70 K to 400 K, and from 200K to 730K. Sample mounting is simple permitting rapid interchange of samples. The Seebeck system is compatible with a variety of computers through an IEEE-488 (GPIA) or RS-232 interface. The Programmable Seebeck Measurement System includes the Programmable Seebeck controller, Programmable Temperature Controller, the Seebeck Thermal Stage and accessories, a computer (PC), and MMR supplied software.   

The Hall Measurement Vacuum chamber can be configured with either spring loaded probes or a Kapton harness, expanding the types of samples that can be measured. Contact with the sample surface can be made through simple pressure on spring loaded probes, or by direct wiring connections to the Kapton harness. 

There are three possible magnets that can be configured to the MMR Technologies' Hall Effect Measurement system, depending on the sample carrier concentrations and mobilities. There is a 0.5 Tesla permanent magnet system and two electromagnets with field strengths of 0.35 Tesla and 1.4 Tesla. These magnets are controlled through the Hall Software, ensuring simple experimental setups and ease of use.

Technologies’ van der Pauw Resistivity and Hall Effect Measurement Systems are noted for their unique features that make them easy and inexpensive to use。

 Modular - you can build the systems up over time to meet your budget and needs

 Bench-top Configuration: Small and compact in size and light in weight

 Fast cool down time (minutes)

 Fast warm up time (minutes)

 Frost free operation

 Complete absence of vibration or microphonics: angstrom level noise measured

 Excellent temperature control and stability

 Wide operating temperature range 70 K to 730 K (-200 °C to +450 °C)

 Low initial cost

 Low operating cost

Electrical Measurement Specifications


      four-Point van der Pauw Measurement Dimension Configurations:

 Spring Loaded Probe Spacing: 0.1 in, 0.2 in, 0.3 in (5.25 mm, 10.5 mm, 15.75 mm)

 Kapton Harness Space: not applicable as all connections are made through soldering

 Measurement Range for Resistivities: 10-4 Ohm*cm to 10+13 Ohm*cm

 Measurement Range for Carrier Mobilities: 1 cm2/volt*sec to 10+7 cm2/volt*sec

 Measurement range of Carrier Concentrations: 10+3 cm-3 to 10+19 cm-3

 Accuracy: ± 2% mid-range, ± 5% end range

 Voltage on probes: ± 2.5 volts maximum

 Current to probe: 10 x 10-3 amps maximum

 Additional electrical feedthroughs: There shall be at least 6 additional electrical feedthroughs available to the user.

Features


Operating Temperature: 70K to 730K

Two 16 bit A/D Converters

Resolution: 50 nV

Mismatch of Gains of reference and test channels: <0。1%

Minimum Heater Step Size: 0.1 mW

Number of Readings Automatically Averaged: Up to 128

Full software provided for all measurements

Sample Length: >2 mm and <10 mm 

Power Input: 110 V, 60 Hz and 220 V, 50 Hz

 

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